JPH0342601B2 - - Google Patents

Info

Publication number
JPH0342601B2
JPH0342601B2 JP58105625A JP10562583A JPH0342601B2 JP H0342601 B2 JPH0342601 B2 JP H0342601B2 JP 58105625 A JP58105625 A JP 58105625A JP 10562583 A JP10562583 A JP 10562583A JP H0342601 B2 JPH0342601 B2 JP H0342601B2
Authority
JP
Japan
Prior art keywords
contact
probe
pivot plate
reference surface
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58105625A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5963501A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5963501A publication Critical patent/JPS5963501A/ja
Publication of JPH0342601B2 publication Critical patent/JPH0342601B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/002—Constructional details of contacts for gauges actuating one or more contacts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
JP58105625A 1982-06-14 1983-06-13 位置検知装置 Granted JPS5963501A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US388187 1982-06-14
US06/388,187 US4451987A (en) 1982-06-14 1982-06-14 Touch probe

Publications (2)

Publication Number Publication Date
JPS5963501A JPS5963501A (ja) 1984-04-11
JPH0342601B2 true JPH0342601B2 (en]) 1991-06-27

Family

ID=23533049

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58105625A Granted JPS5963501A (ja) 1982-06-14 1983-06-13 位置検知装置

Country Status (13)

Country Link
US (1) US4451987A (en])
JP (1) JPS5963501A (en])
AU (1) AU557558B2 (en])
BE (1) BE897040A (en])
BR (1) BR8303114A (en])
CA (1) CA1198188A (en])
DE (1) DE3321454A1 (en])
FR (1) FR2528565B1 (en])
GB (1) GB2121966B (en])
IT (1) IT1170396B (en])
NL (1) NL8302096A (en])
SE (1) SE8303325L (en])
ZA (1) ZA834262B (en])

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4670989A (en) * 1981-04-30 1987-06-09 Gte Valeron Corporation Touch probe using microwave transmission
US5065035A (en) * 1981-04-30 1991-11-12 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
US4401945A (en) * 1981-04-30 1983-08-30 The Valeron Corporation Apparatus for detecting the position of a probe relative to a workpiece
US4510693A (en) * 1982-06-14 1985-04-16 Gte Valeron Corporation Probe with stylus adjustment
DE3234851C2 (de) * 1982-09-21 1985-11-14 Mauser-Werke Oberndorf Gmbh, 7238 Oberndorf Dynamischer Tastkopf
US4608763A (en) * 1983-06-14 1986-09-02 Gte Valeron Corporation Probe
US4543859A (en) * 1983-06-14 1985-10-01 Gte Valeron Corporation Probe adjustment tool and method of using same
US4567672A (en) * 1983-06-16 1986-02-04 Mitutoyo Mfg. Co., Ltd. Coordinate measuring instrument
IT1168698B (it) * 1983-11-21 1987-05-20 Finike Italiana Marposs Testa per il controllo di dimensioni lineari
US4553001A (en) * 1983-12-05 1985-11-12 Gte Valeron Corporation Touch probe having nonconductive contact carriers
US4523063A (en) * 1983-12-05 1985-06-11 Gte Valeron Corporation Touch probe having nonconductive contact carriers
US4542590A (en) * 1984-03-26 1985-09-24 Gte Valeron Corporation Two axis touch probe
US4693110A (en) * 1985-06-06 1987-09-15 Gte Valeron Corporation Method and apparatus for testing the operability of a probe
US4625417A (en) * 1985-06-17 1986-12-02 Gte Valeron Corporation Probe with stylus pressure adjustment
US4658509A (en) * 1985-09-12 1987-04-21 Gte Valeron Corporation Probe having low battery detection/transmission feature
US4603482A (en) * 1985-12-30 1986-08-05 Valeron Corporation Probe shield
US4831743A (en) * 1986-10-15 1989-05-23 Struble James E Fixture rail snap-mountable transducer gage assembly for selectively making outline (gap) and contour checks
US4731935A (en) * 1986-10-15 1988-03-22 Struble James E Contour and outline transducer gage assembly
US4831742A (en) * 1986-10-15 1989-05-23 Struble James E Contour and outline transducer gage assembly
US4780961A (en) * 1986-11-10 1988-11-01 Shelton Russell S Probe assembly and circuit for measuring machine
US4734994A (en) * 1986-12-22 1988-04-05 Gte Valeron Corporation Probe having a plurality of hinged plates
DE3811235A1 (de) * 1987-08-21 1989-10-19 Wegu Messtechnik Dynamischer tastkopf
GB8816358D0 (en) * 1988-07-08 1988-08-10 Renishaw Plc Probe for use with measuring apparatus
US5491904A (en) * 1990-02-23 1996-02-20 Mcmurtry; David R. Touch probe
GB9004117D0 (en) * 1990-02-23 1990-04-18 Renishaw Plc Touch probe
US5253428A (en) * 1990-02-23 1993-10-19 Renishaw Plc Touch probe
JPH07117363B2 (ja) * 1990-11-24 1995-12-18 レニショウ パブリック リミテッド カンパニー 接触プローブ
DE4123081C2 (de) * 1991-07-12 2001-05-17 Zeiss Carl Tastkopf vom schaltenden Typ
GB2281968B (en) * 1993-09-20 1996-05-01 Hunt Grubbe Robert Measuring instruments
GB0118981D0 (en) * 2001-08-03 2001-09-26 Renishaw Plc Electron microscope and spectroscopy system
WO2004068068A1 (de) 2003-01-31 2004-08-12 Carl Zeiss Industrielle Messtechnik Gmbh Tastkopf für ein koordinatenmessgerät
KR100868635B1 (ko) * 2007-05-16 2008-11-12 주식회사 동부하이텍 반도체 소자 검사 장치
US10303270B2 (en) 2016-09-12 2019-05-28 Microsoft Technology Licensing, Llc Linear encoder force transducer
US10663274B2 (en) * 2017-01-27 2020-05-26 Faro Technologies, Inc Articulated arm coordinate measuring machine
US11733021B2 (en) 2021-12-22 2023-08-22 Mitutoyo Corporation Modular configuration for coordinate measuring machine probe
US11713956B2 (en) * 2021-12-22 2023-08-01 Mitutoyo Corporation Shielding for sensor configuration and alignment of coordinate measuring machine probe

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3122970A (en) * 1964-03-03 Certificate of correction
DE1069392B (en]) * 1957-03-25 1959-11-19
US3180030A (en) * 1961-02-23 1965-04-27 Bendix Corp Gage probe
US3219782A (en) * 1962-08-08 1965-11-23 Cincinnati Milling Machine Co Joystick control switch with electromagnetic detent
DE2242355C2 (de) * 1972-08-29 1974-10-17 Fa. Carl Zeiss, 7920 Heidenheim Elektronischer Mehrkoordinatentaster
GB1445977A (en) * 1972-09-21 1976-08-11 Rolls Royce Probes
US4153998A (en) * 1972-09-21 1979-05-15 Rolls-Royce (1971) Limited Probes
GB1551218A (en) * 1975-05-13 1979-08-22 Rolls Royce Probe for use in displacement measuring apparatus
US4158919A (en) * 1976-03-24 1979-06-26 Rolls-Royce Limited Apparatus for measuring displacement in at least two orthogonal dimensions
US4136458A (en) * 1976-10-01 1979-01-30 The Bendix Corporation Bi-axial probe
GB1589297A (en) * 1976-12-24 1981-05-13 Rolls Royce Probe for use in measuring apparatus
IT1088539B (it) * 1976-12-24 1985-06-10 Rolls Royce Sonda per l'uso in apparecchi di misura
DE2712181C3 (de) * 1977-03-19 1981-01-22 Fa. Carl Zeiss, 7920 Heidenheim Tastsystem
SE406228B (sv) * 1977-09-20 1979-01-29 Johansson Ab C E Legesgivare avsedd for kontrollmetning av ytor
IT1107310B (it) * 1978-03-23 1985-11-25 Dea Spa Gruppo di attacco per un montaggio di precisione e di sicurezza di un utensile su una macchina particolarmente una macchina di misura
IT1159663B (it) * 1978-05-09 1987-03-04 Dea Spa Palpatore bidimensionale per macchine utensili o macchine di misura
GB2049198B (en) * 1979-05-01 1983-03-30 Renishaw Electrical Ltd Probe for use in measuring apparatus
FR2458791A1 (fr) * 1979-06-13 1981-01-02 Seiv Automation Dispositif de mesure a commande numerique
JPS5920642Y2 (ja) * 1979-08-28 1984-06-15 株式会社 三豊製作所 タツチ信号プロ−ブ
US4443946A (en) * 1980-07-01 1984-04-24 Renishaw Electrical Limited Probe for measuring workpieces
US4386349A (en) * 1981-04-28 1983-05-31 Sperry Corporation High resolution graphics smoothing
JPS58140404U (ja) * 1982-03-16 1983-09-21 株式会社ミツトヨ タッチ信号プロ−ブ
JPS60303A (ja) * 1983-06-16 1985-01-05 Mitsutoyo Mfg Co Ltd タツチ信号プロ−ブ

Also Published As

Publication number Publication date
IT1170396B (it) 1987-06-03
US4451987A (en) 1984-06-05
SE8303325L (sv) 1983-12-15
CA1198188A (en) 1985-12-17
GB2121966A (en) 1984-01-04
AU1575683A (en) 1983-12-22
IT8348482A0 (it) 1983-06-10
NL8302096A (nl) 1984-01-02
BE897040A (fr) 1983-10-03
FR2528565B1 (fr) 1988-07-29
DE3321454A1 (de) 1983-12-15
FR2528565A1 (fr) 1983-12-16
GB8315940D0 (en) 1983-07-13
ZA834262B (en) 1984-03-28
GB2121966B (en) 1985-09-11
AU557558B2 (en) 1986-12-24
SE8303325D0 (sv) 1983-06-13
BR8303114A (pt) 1984-01-31
JPS5963501A (ja) 1984-04-11
DE3321454C2 (en]) 1993-03-11

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